Application of Wavelength Dispersive X-Ray Spectroscopy in X-Ray Trace Element Analytical Techniques
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منابع مشابه
- iii - LBL - 647 TRACE ELEMENT ANALYSIS WITH SEMICONDUCTOR DETECTOR X - RAY SPECTROMETERS *
A method of obtaining high sensitivity and precision in x-ray fluorescence analysis using semiconductor detector spectrometers is discussed. Monoenergetic exciting radiation is employed to generate characteristic x-rays from trace elements in thin, uniform specimens. Corrections for absorption effects are determined; enhancement effects are omitted as they are negligible for many thin specimens...
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